In addition to film growth, Northwestern University (NU) offers a wide variety of analysis services for films grown at NU or elsewhere.

The following are a few of the capabilities that can be found at the Jerome B. Cohen X-Ray Diffraction Facility

• High-resolution x-ray diffraction (HRXRD)
• Grazing incidence x-ray diffraction (GIXRD)
• X-ray reflectivity (XRR)
• X-ray fluorescence (XRF)
• Grazing incidence small angle x-ray scattering (GISAXS)

The following are a few of the capabilities that can be found at the Electron Probe Instrumentation Center (EPIC)

• Scanning electron microscopy (SEM)
• Energy dispersive spectrometry (EDS) for elemental analysis
• Transmission electron microscopy (TEM)
•  Scanning transmission electron microscopy (STEM)
• Electron energy loss spectroscopy (EELS) point analysis
• Focused-ion beam (FIB)
• Specimen preparation facility (SPF)

The following are a few of the capabilities that can be found at the Keck Interdisciplinary Surface Science facility (Keck-II)

• Time-of-flight secondary ion mass spectrometry (ToF-SIMS
• X-ray photoelectron spectroscopy (XPS)
• Ultraviolet photoelectron spectroscopy (UPS)
• Fourier transform infrared spectroscopy (FT-IR)
• Confocal Raman
• High resolution stylus profilometry
• 3D optical microscopy, spectroscopic ellipsometry

The following can be found at the Keck Biophysics Facility

• Ultraviolet-visible-near infrared spectroscopy (UV-Vis-NIR) with integrating sphere

The following can be found at the Materials Characterization and Imaging Facility

• Hall measurement
• Spectral reflectance thickness measurement

The following can be found at the Scanned Probe Imaging and Development (SPID) facility

• Quantitative and qualitative scanning probe microscopy

For information you can contact the facilities above directly or the PLD facility.