Support Services

In addition to film growth, Northwestern University (NU) offers a wide variety of analysis services for films grown at NU or elsewhere.

The following are a few of the capabilities that can be found at the Jerome B. Cohen X-Ray Diffraction Facility

  • High-resolution x-ray diffraction (HRXRD)
  • Grazing incidence x-ray diffraction (GIXRD)
  • X-ray reflectivity (XRR)
  • X-ray fluorescence (XRF)
  • Grazing incidence small angle x-ray scattering (GISAXS)

The following are a few of the capabilities that can be found at the Electron Probe Instrumentation Center (EPIC)

  • Scanning electron microscopy (SEM)
  • Energy dispersive spectrometry (EDS) for elemental analysis
  • Transmission electron microscopy (TEM)
  •  Scanning transmission electron microscopy (STEM)
  • Electron energy loss spectroscopy (EELS) point analysis
  • Focused-ion beam (FIB)
  • Specimen preparation facility (SPF)

The following are a few of the capabilities that can be found at the Keck Interdisciplinary Surface Science facility (Keck-II)

  • Time-of-flight secondary ion mass spectrometry (ToF-SIMS
  • X-ray photoelectron spectroscopy (XPS)
  • Ultraviolet photoelectron spectroscopy (UPS)
  • Fourier transform infrared spectroscopy (FT-IR)
  • Confocal Raman
  • High resolution stylus profilometry
  • 3D optical microscopy, spectroscopic ellipsometry

The following can be found at the Keck Biophysics Facility

  • Ultraviolet-visible-near infrared spectroscopy (UV-Vis-NIR) with integrating sphere

The following can be found at the Materials Characterization and Imaging Facility

  • Hall measurement
  • Spectral reflectance thickness measurement

The following can be found at the Scanned Probe Imaging and Development (SPID) facility

  • Quantitative and qualitative scanning probe microscopy

For information you can contact the facilities above directly or the PLD facility.