Atomic Force Microscope Tip Enhanced Raman Spectroscopy (AFM-TERS)

TERS is a powerful analytical method that marries the single-molecule chemical sensitivity of SERS and the sub-diffraction limited spatial resolution of scanning probe microscopy (SPM). Unlike SERS, TERS is a surface-general technique because the enhancing probe, as shown in the SEM image above, is independent of the surface. Using the atomic force microscope (AFM) TERS instrumentation (schematic above), we are currently exploring the substrate limitations and sensitivity of TERS. We are also interested in applying TERS as a highly sensitive, non-destructive technique to study objects related to cultural heritage research.

Stephanie Zaleski, 3rd year graduate student
Dmitry Kurouski, postdoctoral fellow

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  • Professor Richard Van Duyne

    Additional Information

    Discoverer of Surface-enhanced Raman Spectroscopy (1977)
    Inventor of Nanosphere Lithography (1995) & Localized Surface Plasmon Resonance Spectroscopy (2000)

  • Group Members

    Professor Van Duyne has, in his career to date, advised a total of 87 graduate students and 47 postdoctoral fellows. Every year, Professor Van Duyne gives a talk to introduce new graduate students to our research. The 2017 seminar slides are available here.

  • News

    Professor Van Duyne was recently named a Vannevar Bush Faculty Fellow by the U.S. Department of Defense to conduct "high risk, high payoff" basic scientific research. Read more here